Dr. Vassilis Psycharis is Director of Research at INN and he was appointed Assistant Director of the IMS during the period of 2009-2010. His scientific interests and research activities cover almost all areas of research in X-ray crystallography, i.e. single crystal studies by X-ray diffraction methods; crystal structure analysis by the Rietveld Method of X-ray powder diffraction patterns; crystal structure physical property correlation studies of organic superconductors, HTc superconducting ceramic materials, hard magnetic materials and molecular magnets; thin film and small particles studies by X-ray diffraction techniques; instrumentation for powder diffraction applications. He also uses occasionally large facilities, such as Neutron and Synchrotron, for structural studies depending on the problem complexity. He has published more than 250 papers in international peer-reviewed Journals. He has more than 2300 hetero-citations and an h index of 32.